The Molecular Analysis Facility (MAF) is a state-of-the-art characterization facility that provides high end characterization tools to all users in the Pacific Northwest and beyond.
The MAF Characterization Workshop, Aug. 22-23, includes lectures in the morning and instrument ‘hands on’ demonstrations in the afternoon. Due to capacity of our lab space, the registration number for the demos part of the workshop is limited. This year the MAF is also offering a lectures only option for the workshop at a reduced cost.
The demonstrations on MAF instruments will provide application examples for the material covered in the workshop lectures. The workshop is taught by experienced MAF staff and faculty. Attendees will learn the capabilities of various surface analysis methods, compositional analysis, and electron microscopy imaging as well as how to intelligently review the data from these characterization tools. The workshop will focus on the following methods:
- X-ray Photoelectron Spectroscopy (XPS/ESCA)
- Secondary Ion Mass Spectrometry (SIMS)
- Scanning Probe Microscopy (SPM/AFM)
- X-Ray Diffraction (XRD)
- Scanning Electron Microscopy (SEM)
- Transmission Electron Microscopy (TEM)
REGISTRATION INFORMATION and FEES
Lectures and instrument DEMOS:
Student/Postdoc Rate $80
Academic/Gov’t Rate $150
General Rate $400
Lectures only:
Student/Postdoc Rate $40
Academic/Gov’t Rate $75
General Rate $200
Registration:
Space is limited for the workshop. The registration deadline is August 12th. Please register here. For registration using a UW budget number please email UWMAF@uw.edu.
Registration may be closed early when the workshop reaches capacity. If registration is closed please contact UWMAF@uw.edu to be put on the waiting list.
The workshop will be in the Molecular Analysis Facility (MAF) at the University of Washington and nearby UW Architecture Building (across the street from the MAF).